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- AC and DC electrical characterization – I-V, C-V, impedance (78 to 690 K)
- Thin film resistivity measurement – van der Pauw (VDP) method, four point probe (4PP) method
- Deep level transient spectroscopy (DLTS) – up to 690 K
- Hall-effect measurements
- Standard electrical and magneto-electrical transport measurements – temperature range 10-350K
- Optical characterization – photoluminescence, photoconductance and photoreflectance in the UV/VIS range
- Gas sensor measurements – response/recovery time, stability, reproducibility, repeatability, reversibility, selectivity etc.
- Optical power measurement
- m-line spectroscopy
- Raman spectroscopy characterization – lasers 532 nm, 633 nm and 830 nm, temperatures from 78 to 690 K
- AFM/SPM characterization of thin films