Tel: +420-22435 2262
Fax: +420-22431 0792
Téma doktorské práce (Thesis topic): An Automated method for characterization of integrated-ESD-protection models
Školitel (Tutor): doc. Ing. Jiří Jakovenko, Ph.D.
Výzkumné aktivity (Research Activities)
Main areas of professional interest of Tomáš Nápravník include but are not limited to on-chip I/O design and ESD characterization, analog RF design, and sub-micron Process Design Kit (PDK) development and support.
His research activities involves ESD protection devices modeling and their automated characterization.
Tomáš Nápravník studied and successfully graduated at FEE CTU in 2011 when he joined FEE Microsystems research group the same year focusing on silicon integrated systems, specifically ESD protection structures.
He started his professional career in ASICentrum s.r.o., a company of the SWATCH Group in mid 2011 as I/O designer and PDK design support engineer. Here he participated on development of universal I/O pad library and implementation of Process Design Kit (PDK) for an in-house sub-micron technology.
He moved to ONSemiconductor Slovakia a.s. in the beginning of 2014 where he worked as analog designer specializing at LDO design in high-voltage-tolerant bipolar processes for automotive applications.
His thirst for knowledge and new challenges drove him back to Prague in 2015 where he joined well-established design center of S3 Group. Joining analog RF design team he worked on receiver and transmitter sections of RF-energy based contact-less charging system for low-power devices.
Napravnik T., Kote V., Molata V., and Jakovenko J., „Differential evolutionary optimization algorithm applied to ESD MOSFET model fitting problem“, Design and Diagnostics of Electronic Circuits Systems (DDECS), 2012 IEEE 15th International Symposium on, pp. 155–158, April 2012.
Napravnik T., Kote V., Molata V., and Jakovenko J., „Utilization of differential evolutionary optimization algorithm for ESD MOSFET model fitting“, IMAPS EDS 2011, June 2012.
Napravnik T., Ziska P., and Jakovenko J., “ESD LVTSCR model calibration by differential evolutionary optimization algorithm“, 2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS), February 2013
Napravnik T., Ziska P., and Jakovenko J., „Novel Model Calibration Method Based on Differential Evolution Used for SCR Model Fitting“, Design and Diagnostics of Electronic Circuits Systems (DDECS), 2013 IEEE 16th International Symposium on, pp.~297–298, April 2013.
Napravnik T., Ziska P., and Jakovenko J., „Automated model calibration flow based on Differential Evolution used for ESD MVTSCR model fitting“, IMAPS EDS 2013, June 2013.